FACILITIES 


1.X-ray Photoelectron Spectroscopy (XPS) KratosAXIS-Ultra system for high resolutionchemical imaging and spectroscopy of surfaces. This $600,000 facility was set up with the recent NSF-MRI grant to thePrincipal Investigator and is specially suited for multi-component solids suchas composites.   Thisdual-chamber unit consists of a sample preparation/treatment chamber where onecan perform vapor deposition, heating/cooling, adsorption etc. and a mainanalysis chamber for ion bombardment, Spectroscopy and chemical state mapping.

 

 

 

* Overviewof XPS

  

visithttp://www.kratos.com/Axis/AXISUltra.html for more information

 

 

 

2.Feild Emission Electron Microscope (FESEM) : Under Construction. CLICK ON THE LINKS BELOW FOR INFORMATION ABOUT THE MACHINE  

 

 

 

* Overviewof FESEM

  

visithttp://www.jeol.com/PRODUCTS/ElectronOptics/ScanningElectronMicroscopesSEM/ConventionalFE/JSM7001F/tabid/460/Default.aspx for more information

 

 

 

JEOL100CXII Transmission ElectronMicroscope with 0.5 nm resolution, TN 5500 EDS system

 

 

 

 

        * Overviewof TEM

 

    visit http://www.jeol.com/tem/tem.htmlfor more information

     

      

4.JEOL 35 Scanning Electron Microscope with 8 nm resolution, Backscattereddetection, Kevax 800 EDS system, SiLi Detector.

           

 

 

 

      * Overviewof SEM

 

    visit http://www.jeol.com/sem/sem.htmlfor more information

 

 

5.Specimen Preparation: Ion Mill, Electro-chemical Polishing, StandardMetallography, Sputter Coating.

  

6.X-ray Diffraction with Philips/Norelco Diffractometer, Philips MRD Triple Axis X-ray Diffraction System, BEDE Double Crystal Diffractometer System, Rigaku Thin Film X-ray Diffractometer, Jade diffraction data-base for fast identification ofmaterial and phases.

 

7.Optical Microscopy, Metallographics (Nikon & others), Numarski and polarized light capabilities, Image Processing and Analysis, Buehler Omnimet, Scanning and Electronic Image Processing Capability

                

8.Electronics For Superconducting Transport Measurement, a system to measure the transport properties of High Temperature Superconducting materials (HTS) including two HP nanovoltmeter, a HP programmable current source, and three sample probes.

                

9.PROCESSING: 2800 C Furnace with  Controlled Atmosphere Capability, Fully computerized data acquisition and processing, Thermogravimetric System with Cahn Microbalance, MTS + Brew High Temp Controlled Atmosphere Dake with heated dies, Several Lindberg furnaces, Sieve, IsostaticCompression press

      

 

 

 

 

 

                  

                  Sintering setup                                                                                          CVD processing setup

          

MTS

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